


5E-XRF2500 EDXRF Spectrometer adopts energy dispersive X-ray fluorescence spectrum (EDXRF), which is a qualitative and quantitative analysis technique for rapid and nondestructive determination of major and minor elements in various types of samples (solid, powder, liquid).
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Every second counts for process and quality control. Test results are urgently needed from the moment the sample is received. 5E-XRF2500 is equipped with a simple and intuitive interface that allows you to load samples, touch the button, and get high-quality results in seconds.
Compared with AAS,AFS,ICP and ICP-MS analysis technology, there is no need for XRF2500 to dissolve and digest samples, or use chemical reagent. The analysis speed of it is rapid without destroying samples. 5E-XRF2500 can be used to analyze samples, whether solid or liquid, pressed or powder, large or small.
Wide Applicability: Suitable for solid, liquid, powder and particle samples.
| Model | 5E-XRF2500 EDXRF Spectrometer |
| Elements | All elements from Na-U |
| Concentration Range | ppm-100% |
| Application Scope | Phosphorus in coal and coal ash composition analysis (Na2O, MgO, Al2O3, SiO2, P2O5,SO3, K2O, CaO,Fe2O3, etc.);Cement, RoHS, geological mining, plastic polymer, petrochemical, metal, environmental protection, medicine, archaeological art, food and cosmetics. |
| Sample types | Powder, Particle, Solution, Sol, Solid, etc. |
| Sample Rotation | Increase the test area by rotating the sample to improve the repeatability and accuracy |
| Auto Feeding(Optional) | Automatic continuous feeder able to load more than 20 samples, greatly reduce the repetitive operation and improve work efficiency |
| X-Ray Tube | Optional target materials Max Power: 50W Max Voltage: 50KV Max Current:1mA |
| Detectors | VITUS (or VITUS LE) Silicon Drift Detector Energy Resolution: 127eV FWHM @ Mn Kα Count Rate: 100000cps Peltier Cooling |
| He Scour System | The built-in helium scour system improves the testing performance of powder samples. |
| Pollution Protection System | Integrated detector and x-ray tube protection system to avoid liquid sample leakage, solid sample falling particles and damage to detector and x-ray tube by dust. |
| Vacuum System | Tablet sample is measured in vacuum mode and does not consume any helium. |
| Radiation Safety | Conform to GBZ115—2002 Radiological protection standards for X-ray diffraction and fluorescence analysis equipment |
| Dimensions(L×W×H) | 690×630×405mm |
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